National Instruments' 17th annual NIWeek will take place Aug. 2-4 in Austin, Texas. At the technology conference, attendees can explore technologies such as graphical system design to test, measure and fix inefficient products and processes. Attendees participate in technical sessions, interactive demonstrations and keynotes to gain advanced technical knowledge and network with peers and NI developers.
"Graphical system design has gone mainstream, adopted by engineers worldwide for far-reaching and impactful applications," said James Truchard, NI's CEO, president and cofounder. "NIWeek will explore the technology behind graphical system design, how it is used, and how you can apply it to increase your productivity."
NIWeek 2011 will feature more than 250 technical presentations by NI engineers and industry experts. There will be five technical summits focused on aerospace and defense, energy technology, RF and wireless, robotics and autonomous vehicles, and vision. Four technical tracks will concentrate on embedded monitoring and control, software development techniques, test and data acquisition, and structural test and measurement. The exhibit floor will include interactice demonstrations from more than 75 companies, including Alfamation, Averna, Cal-Bay Systems, Texas Instruments and Xilinx.
For more information about NIWeek 2011 or to register for the conference, visit ni.com/niweek.