MTS's Universal Tester III

July 6, 2007
Universal tester meets the need for next-generation linear positioning sensors

Critical Tester for Sensors

Universal Tester III meets the need for next-generation linear positioning sensors. It is based on a precision-grade, belt-driven linear module with overall resolution of 79-nanometers. Additionally, the system allows compensation for temperature and pressure variations and performs all test functions 20 percent faster than previous generation testers. MTS Sensors Div.; 919/677-0100; www.mtssensors.com