Filtering Out of All the 'Noise'

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As processing speeds in electronics continue to rise, and packaging continues to shrink, sensitive internal components are located closer and closer together. Higher clock speeds coupled with increased density of components leads to increasing amounts of electromagnetic interference (EMI) and Radio Frequency Interference (RFI) noise.

Such noise can be detrimental to the performance of communication and computing systems and also cause false triggering and faulty readings in vital sensor circuits, resulting in system failures. Additionally, this noise can make systems incompatible with each other and cause them to be non-compliant with established military and commercial requirements.

This white paper dicusses why it is increasingly important for engineers to address the varying need for EMI/RFI/EMP protection along with that of transient voltages during the design and test phases of a project. If they do not, they run the risk of failing compliance testing and the accompanying possibility of incurring high costs in redesigning and retesting the electronic systems or components they are developing.